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P7.1.2.4 Debye-Scherrer Scan: Determining the Lattice Plane Spacings of Polycrystalline Powder Samples
P7.1.2.4 Debye-Scherrer Scan: Determining the Lattice Plane Spacings of Polycrystalline Powder Samples
Leybold LD Didactic

P7.1.2.4 Debye-Scherrer Scan: Determining the Lattice Plane Spacings of Polycrystalline Powder Samples

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Debye-Scherrer Scan: Determining the Lattice Plane Spacings of Polycrystalline Powder Samples

The experiment P7.1.2.4 records the Debye-Scherrer pattern with an end window counter instead of X-ray film. The diffracted reflections of a fine powder sample are recorded as a function of diffraction angle. The intensity peaks  in the diffraction spectrum allow the calculation of the separations of adjacent lattice planes.

COMPONENTS OF EQUIPMENT SETS

1 554 800 X-ray apparatus
1 554 862 X-ray tube, Cu
1 554 831 Goniometer
1 559 01 End-window counter with cable for α, β, γ and X-rays
1 554 842 Crystal powder holder
1 673 5700 Sodium chloride, 250 g
1 673 0520 Lithium fluoride, analytically pure, 10 g
1 667 091 Pestle, 96 mm long
1 667 092 Mortar, porcelain, 70 mm Ø
1 666 960 Powder spatula, stainless steel, 150 mm
1 additionally required:
PC with Windows XP/Vista/7/8/10 (x86 or x64)


EXPERIMENT INSTRUCTIONS PLEASE CLICK HERE