P7.1.2.4 Debye-Scherrer Scan: Determining the Lattice Plane Spacings of Polycrystalline Powder Samples
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Debye-Scherrer Scan: Determining the Lattice Plane Spacings of Polycrystalline Powder Samples
The experiment P7.1.2.4 records the Debye-Scherrer pattern with an end window counter instead of X-ray film. The diffracted reflections of a fine powder sample are recorded as a function of diffraction angle. The intensity peaks in the diffraction spectrum allow the calculation of the separations of adjacent lattice planes.COMPONENTS OF EQUIPMENT SETS
| 1 | 554 800 | X-ray apparatus |
| 1 | 554 862 | X-ray tube, Cu |
| 1 | 554 831 | Goniometer |
| 1 | 559 01 | End-window counter with cable for α, β, γ and X-rays |
| 1 | 554 842 | Crystal powder holder |
| 1 | 673 5700 | Sodium chloride, 250 g |
| 1 | 673 0520 | Lithium fluoride, analytically pure, 10 g |
| 1 | 667 091 | Pestle, 96 mm long |
| 1 | 667 092 | Mortar, porcelain, 70 mm Ø |
| 1 | 666 960 | Powder spatula, stainless steel, 150 mm |
| 1 | additionally required: PC with Windows XP/Vista/7/8/10 (x86 or x64) |
EXPERIMENT INSTRUCTIONS PLEASE CLICK HERE
